Compound Semiconductors | Foundry Services | SCIVAX
Foundry Application

Compound Semiconductors

High-precision grating formation on compound semiconductor substrates such as GaAs and InP. We support lambda/4 phase shifts and wavelength tuning for DFB lasers, enabling high-throughput mass production.

Compound semiconductor grating
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Why Choose SCIVAX
01

Sub-nm-Level Pitch Control

Pattern pitch is controlled at the sub-nanometer level, enabling stable formation of high-precision gratings on compound semiconductor substrates for mass production.

02

Support for Lambda Shift and Chirped Gratings

We support lambda/4 phase-shift gratings and chirped gratings (pitch-modulated gratings). By incorporating design information into the master mold, complex optical structures can be mass-produced with high precision and repeatability.

03

±1 μm-Level Alignment

Alignment accuracy of ±1 um is possible.

04

Support for phi 2″ to phi 8″ Substrates

Mass production is supported for compound semiconductor substrates such as InP and GaAs from phi 2″ to phi 8″.

05

Contract Processing from 10 to 1,000 Wafers/Month

We flexibly support everything from small-lot prototyping to mass production at the 1,000 wafers/month level, with integrated support for production launch.

Specifications
ItemSpecifications / Supported Range
Supported Substrate MaterialsInP, GaAs, and other compound semiconductors
Substrate Sizeφ2″ – φ8″
Pitch AccuracySub-nm-level control
Grating StructuresUniform gratings, lambda/4 phase shift, chirped gratings
Alignment Accuracy±1 μm level
Production Scale10 to 1,000 wafers/month (up to 50 wafers/day)
Lead Time (Prototype)Test pattern fabrication: about 2 months plus evaluation / mold fabrication: 1 to 1.5 months
Process Flow
Epitaxial Growth and HM Film Deposition
Step 1 — Customer
Epitaxial Growth and HM Film Deposition
Epitaxial growth and SiO2/SiN hard mask deposition on a compound semiconductor substrate
Nanoimprint
Step 2 — SCIVAX
Nanoimprint
Nanoimprint the grating pattern
Residual Layer and HM Etching
Step 3 — Customer
Residual Layer and HM Etching
Pattern the residual layer and hard mask by dry etching
Grating Etching and Removal
Step 4 — Customer
Grating Etching and Removal
After dry/wet etching the grating layer, remove the NIL layer and HM
Molding Examples
3-inch InP wafer DFB grating

DFB Grating Formation on a 3-Inch InP Wafer

A 200 nm pitch grating is uniformly formed across the entire 3-inch InP wafer, achieving oscillation wavelength variation within ±0.1 nm.

12-inch Si wafer 50 nm L/S

Half-Pitch 50 nm L/S (12-Inch Si Wafer)

Half-pitch 50 nm L/S on a 12-inch Si wafer

Molding example 3

Molding Examples

lambda/4 Phase-Shift Structure

Molding example 4

Molding Examples

Residual layer <30 nm


Foundry Consultation for Compound Semiconductors

We will propose a solution tailored to your specifications and production scale. Please feel free to contact us.

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